Method and apparatus for forming self-aligned via with selectively deposited etching stop layer

ABSTRACT

A first layer is located over a substrate. The first layer includes a first dielectric component and a first conductive component. A first etching stop layer is located over the first dielectric component. A metal capping layer is located over the first conductive component. A second etching stop layer is located over the first etching stop layer and over the metal capping layer. A second layer is located over the second etching stop layer. The second layer includes a second dielectric component and a second conductive component. A third conductive component electrically interconnects the second conductive component to the first conductive component.

PRIORITY DATA

This application is a continuation of U.S. patent application Ser. No.15/601,562, filed May 22, 2017, now U.S. Pat. No. 9,922,927 which is acontinuation of U.S. patent application Ser. No. 14/887,396, filed Oct.20, 2015, now U.S. Pat. No. 9,659,864, the entire disclosures of whichare incorporated herein by reference.

BACKGROUND

The semiconductor integrated circuit (IC) industry has experienced rapidgrowth. Technological advances in IC materials and design have producedgenerations of ICs where each generation has smaller and more complexcircuits than the previous generation. However, these advances haveincreased the complexity of processing and manufacturing ICs and, forthese advances to be realized, similar developments in IC processing andmanufacturing are needed. In the course of integrated circuit evolution,functional density (i.e., the number of interconnected devices per chiparea) has generally increased while geometry size (i.e., the smallestcomponent (or line) that can be created using a fabrication process) hasdecreased.

As a part of the semiconductor fabrication, conductive elements may beformed to provide electrical interconnections for the various componentsfor an IC. For example, conductive vias for interconnecting differentmetal layers may be formed by etching openings in an interlayerdielectric (ILD) and filling the openings with a conductive material.However, as semiconductor fabrication technology nodes continue toevolve, critical dimensions and pitches are becoming smaller andsmaller, and the process windows are becoming tighter. Consequently,overlay errors (e.g., misaligned via) may occur, which may lead toproblems such as reduced reliability test margin or poor deviceperformance.

Therefore, while conventional via formation processes have beengenerally adequate for their intended purposes, they have not beenentirely satisfactory in every aspect.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isemphasized that, in accordance with the standard practice in theindustry, various features are not drawn to scale. In fact, thedimensions of the various features may be arbitrarily increased orreduced for clarity of discussion.

FIGS. 1-14 are diagrammatic cross-sectional side views of asemiconductor device at various stages of fabrication in accordance withsome embodiments of the present disclosure.

FIG. 15 is a flowchart illustrating a method of fabricating asemiconductor device in accordance with some embodiments of the presentdisclosure.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

As a part of semiconductor fabrication, electrical interconnections needto be formed to electrically interconnect the various microelectronicelements (e.g., source/drain, gate, etc.) of the semiconductor device.Generally, this involves forming openings in layers (such as inelectrically insulating layers), and subsequently filling these openingswith an electrically conductive material. The electrically conductivematerial is then polished to form the electrical interconnections suchas metal lines or vias.

However, as semiconductor technology generations continue thescaling-down process, accurate alignment or overlay may becomeproblematic due to the ever-decreasing trench sizes. For example, it maybe more difficult for vias to be accurately aligned with the desiredmetal lines above or below. When via misalignment or overlay problemsoccur, conventional methods of fabrication may lead to undesirableover-etching of a dielectric material (e.g., ILD) below the via opening.When the via opening is later filled with a metal material, its shapesresembles a tiger tooth. Such “tiger tooth” vias may lead to poor deviceperformance. Tighter process windows may need to be used to avoid theseproblems, but that may degrade device performance as well.

To improve via alignment and to avoid over-etching of the ILD during thevia formation, the present disclosure proposes a novel method andstructure utilizing selective deposition of an etching stop layer toenlarge the process window without sacrificing performance. The variousaspects of the present disclosure will now be discussed in more detailwith reference to FIGS. 1-15.

FIGS. 1-4 are diagrammatic fragmentary cross-sectional side views of asemiconductor device 50 at various stages of fabrication in accordancewith various aspects of the present disclosure. The semiconductor device50 is fabricated under a semiconductor technology node that is5-nanometers or lower. The semiconductor device 50 may include anintegrated circuit (IC) chip, system on chip (SoC), or portion thereof,and may include various passive and active microelectronic devices suchas resistors, capacitors, inductors, diodes, metal-oxide semiconductorfield effect transistors (MOSFET), complementary metal-oxidesemiconductor (CMOS) transistors, bipolar junction transistors (BJT),laterally diffused MOS (LDMOS) transistors, high power MOS transistors,or other types of transistors.

The semiconductor device 50 includes a substrate 60. In someembodiments, the substrate 60 is a silicon substrate doped with a p-typedopant such as boron (for example a p-type substrate). Alternatively,the substrate 60 could be another suitable semiconductor material. Forexample, the substrate 60 may be a silicon substrate that is doped withan n-type dopant such as phosphorous or arsenic (an n-type substrate).The substrate 60 could include other elementary semiconductors such asgermanium and diamond. The substrate 60 could optionally include acompound semiconductor and/or an alloy semiconductor. Further, thesubstrate 60 could include an epitaxial layer (epi layer), may bestrained for performance enhancement, and may include asilicon-on-insulator (SOI) structure.

In some embodiments, the substrate 60 is substantially conductive orsemi-conductive. The electrical resistance may be less than about 10³ohm-meter. In some embodiments, the substrate 60 contains metal, metalalloy, or metal nitride/sulfide/selenide/oxide/silicide with the formulaMXa, where M is a metal, and X is N, S, Se, O, Si, and where “a” is in arange from about 0.4 to 2.5. For example, the substrate 60 may containTi, Al, Co, Ru, TiN, WN2, or TaN.

In some other embodiments, the substrate 60 contains a dielectricmaterial with a dielectric constant in a range from about 1 to about 40.In some other embodiments, the substrate 60 contains Si, metal oxide, ormetal nitride, where the formula is MXb, wherein M is a metal or Si, andX is N or O, and wherein “b” is in a range from about 0.4 to 2.5. Forexample, the substrate 60 may contain SiO₂, silicon nitride, aluminumoxide, hafnium oxide, or lanthanum oxide.

It is understood that a plurality of drains/sources may be formed in thesubstrate 60, and a plurality of gates may be formed over the substrate60. For reasons of simplicity, however, these drains/sources or gatesare not specifically illustrated herein.

A dielectric layer 70 is formed over the substrate 60. The dielectriclayer 70 may be formed using a deposition process. In variousembodiments, the dielectric layer 70 may contain a low-k dielectricmaterial. A low-k dielectric material may refer to a dielectric materialhaving a dielectric constant lower than the dielectric constant ofsilicon dioxide, which is about 3.9. As non-limiting examples, the low-kdielectric material may include fluorine-doped silicon dioxide,carbon-doped silicon dioxide, porous silicon dioxide, porouscarbon-doped silicon dioxide, spin-on organic polymeric dielectricmaterials, or spin-on silicon based polymeric dielectric materials.

A plurality of conductive elements 80 are formed in the dielectric layer70. The conductive elements 80 are also referred to as metal lines of aM_(X) interconnect layer of a multilayered interconnect structure. Theconductive elements 80 are formed by etching openings in the dielectriclayer 70 and filling the openings with a conductive material. In someembodiments, the conductive material may contain copper or aluminum. Apolishing process (such as chemical mechanical polishing) 90 isperformed to polish the upper surfaces of the dielectric material 70 andthe conductive elements 80.

Referring now to FIG. 2, an etching stop layer 100 (also referred to asetching-stop layer or etch stop layer) is formed over the upper surfacesof dielectric layer 70, but not on the conductive elements 80. Theetching stop layer 100 is formed to contain metal oxide. The etchingstop layer is formed via a selective atomic layer deposition (SALD)process 110. In the SALD process 110, alternating cycles are performed.In one cycle, a precursor gas is turned on. In another cycle, an oxidantgas is turned on. These cycles are repeated for a number of times, whichcan be precisely controlled to grow a desired material of a desiredthickness.

The process conditions of the SALD process 110 are as follows:

In one embodiment, the precursor gas includesTetrakisethylmethylaminohafnium (TEMAHf):

In this embodiment, the process temperature is in a range from about 200degrees Celsius to about 400 degrees Celsius. The vapor pressure isabout 0.1 torr at 70 degrees Celsius. The oxidant gas may contain H₂O,(H₂+O₂), or O₃. As a result, hafnium oxide is formed as the material forthe etching stop layer 100. The dielectric constant value of the etchingstop layer 100 is about 18.5, its associated leakage current is about4×10⁻¹² amps, and its associated electric breakdown strength (EBD) isabout 7.4 millivolts per centimeter.

In another embodiment, the precursor gas includestetrakis(ethylmethylamido)zirconium (TEMA-Zr):

In this embodiment, the process temperature is in a range from about 200degrees Celsius to about 400 degrees Celsius. The vapor pressure isabout 0.1 torr at 70 degrees Celsius. The oxidant gas may contain H₂O,(H₂+O₂), or O₃. As a result, zirconium oxide is formed as the materialfor the etching stop layer 100. The dielectric constant value of theetching stop layer 100 is about 20, its associated leakage current isabout 1×10⁻¹² amps, and its associated electric breakdown strength (EBD)is about 5.6 millivolts per centimeter.

In yet another embodiment, the precursor gas includes Trimethyl Aluminum(TMA):

In this embodiment, the process temperature is in a range from about 200degrees Celsius to about 400 degrees Celsius. The vapor pressure isabout 100 torr at 70 degrees Celsius. The oxidant gas may contain H₂O,(H₂+O₂), or O₃. As a result, aluminum oxide is formed as the materialfor the etching stop layer 100. The dielectric constant value of theetching stop layer 100 is about 8.2, its associated leakage current isless than about 1×10⁻¹² amps, and its associated electric breakdownstrength (EBD) is about 8.2 millivolts per centimeter.

In yet another embodiment, the precursor gas includesTetrakis(dimethylamido) Aluminum (TDMAA):

In this embodiment, the process temperature is in a range from about 200degrees Celsius to about 400 degrees Celsius. The vapor pressure isabout 0.2 torr at 70 degrees Celsius. The oxidant gas may contain H₂O,(H₂+O₂), or O₃. As a result, aluminum oxide is formed as the materialfor the etching stop layer 100. The dielectric constant value of theetching stop layer 100 is about 8.2, its associated leakage current isless than about 1×10⁻¹² amps, and its associated electric breakdownstrength (EBD) is about 8.2 millivolts per centimeter.

As is illustrated in FIG. 2, the etching stop layer 100 is formed tohave a relatively co-planar surface (i.e., within a few angstroms orless) with the conductive elements 80. This may be accomplished in oneof two ways. In one embodiment, the polishing process 90 (shown inFIG. 1) may be configured such that the dielectric material 70 has alower upper surface than the conductive elements 80. In other words, thedielectric material 70 may be “over-polished” to form “recesses”. Theetching stop layer 100 may then be formed to fill these “recesses” bythe SALD process 110 so as to be relatively co-planar with theconductive elements 80. In another embodiment, the dielectric material70 is removed in an etching process to form the “recesses”, which arethen filled by the etching stop layer 100 by the SALD process 110.

The etching stop layer 100 is formed to have a thickness 120. In someembodiments, the thickness 120 is in a range from about 2 nanometers toabout 5 nanometers. The thickness range is selected because if it is toothin, then the etching stop layer 100 may not be able to adequatelyserve the etching stop function in a later process (discussed below inmore detail). On the other hand, if the thickness 120 is too thick, theselective growth (i.e., growing on the surface of the dielectricmaterial 70 but not on the surface of the conductive elements 80) may bedifficult to control, and it is possible that some portions of theetching stop layer 100 may “spill over” to the surfaces of theconductive elements 80. Thus, the thickness range of 2-5 nanometersrepresents an optimum thickness range for the etching stop layer 100.

Referring now to FIG. 3, another etching stop layer 130 is formed overthe etching stop layer 100 and over the conductive elements 80. Theetching stop layer 130 has a different material composition than theetching stop layer 100. The etching stop layer 130 may be formed by achemical vapor deposition (CVD) process. In some embodiments, theetching stop layer 130 contains silicon oxycarbide (SiOC) or siliconoxynitride (SiON). The etching stop layer 130 also is formed with athickness 140. The thickness 140 is in a range from about 2 nanometersto about 8 nanometers in some embodiments. In some embodiments, thethickness 140 is in a range from about 30 nanometers to about 60nanometers. The thickness 140 is tuned so that the etching stop layer130 can adequately serve its purpose as an etching-stop layer in a lateretching process discussed below.

Still referring to FIG. 3, a dielectric material 150 is formed over theetching stop layer 130. The dielectric material 150 may have a similarmaterial composition to the dielectric material 70. For example, thedielectric material 150 may also contain a low-k dielectric materialdiscussed above. Both the dielectric material 70 and the dielectricmaterial 150 may also be referred to as interlayer dielectric (ILD) ofan interconnect structure.

Referring now to FIG. 4, a via 160 and a conductive element 180 areformed in the dielectric material 150. The conductive element 180 isalso referred to as a metal line of a M_(X+1) interconnect layer of themultilayered interconnect structure (the via 160 may or may not beconsidered to be a part of the M_(X+1) interconnect layer). As is shownin FIG. 4, the conductive element 180 is formed above (and comes intodirect physical contact with) the via 160. The via 160 is at leastpartially aligned with the conductive element 80. As is shown in FIG. 4,the via 160 is formed to extend through the etching stop layer 130 andcomes into direct physical contact with one of the conductive element80. In this manner, the via 160 electrically interconnects together theconductive elements 80 and 180. Stated differently, the via 160electrically interconnects together the metal lines of the M_(X)interconnect layer and the M_(X+1) interconnect layer.

In some embodiments, the via 160 and the conductive element 180 areformed using a dual damascene process. In other embodiments, the via 160and the conductive element 180 are formed using a single damasceneprocess. Regardless, the damascene process used to form the via 160includes etching processes. For example, in a first etching process, arecess or opening is etched in the dielectric material 150, while theetching stop layer 130 serves as an etching stop layer herein to preventthe layers therebelow from being etched. C4F8, CF4, N2, Ar may be usedas etchants. Thereafter, the etching stop layer 130 itself is “opened”in another etching process so as to extent the recess or opening down tothe conductive element 80. C4F8, C4F6, CF4, or N2 may be used asetchants.

Conventionally, the etching stop layer 100 is not formed. Consequently,the etching process for opening the etching stop layer 130 mayinadvertently “punch through” the etching stop layer 130 and causeportions of the dielectric material 70 therebelow to also be etched.Thereafter, when the etched recess or opening is filled with aconductive material to form the via 160, a portion of the via 160 wouldextend into the dielectric material 70, resembling a “tiger tooth.” Thistiger tooth effect is exacerbated as the misalignment between the via160 and the conductive element 80 worsens. As a result, deviceperformance such as reliability (e.g., measured by time-dependentdielectric breakdown, or TDDB) may suffer, and/or excessive contactresistance problems may arise from gap fill void.

The present disclosure prevents the over-etching of the dielectricmaterial 70 by forming the etching stop layer 100. The materialcomposition of the etching stop layer 100 is configured to have a highetching selectivity (e.g., greater than 1:100) with respect to theetching stop layer 130 during the etching process to “open” the etchingstop layer 130. In this manner, while the etching stop layer 130 is“opened”, little to no portion of the etching stop layer 100 is removed.Hence, even if there is misalignment between the via 160 and theconductive element 80, no portion of the via 160 would punch through thedielectric material 70 (because it is stopped by the etching stop layer100) to form the “tiger tooth” discussed above. Stated differently, theportion of the via 160 that is offset from the conductive element 80 isformed on the etching stop layer 100 according to the presentdisclosure.

Since the “tiger tooth” via punch through is no longer a problem, theprocess windows for forming the via 160 can be relaxed, and the deviceperformance may be improved as well. For example, since misalignmentwill likely not lead to the “tiger tooth”-like via punch through, thevia 160 can be made to be bigger (e.g., wider lateral dimension) toensure that there is physical contact between the via 160 and theconductive element 80. The greater via size may reduce contactresistance, in addition to relaxing gap filling windows in the damasceneprocess.

FIGS. 5-9 are diagrammatic fragmentary cross-sectional side views of thesemiconductor device 50 at various stages of fabrication in accordancewith another embodiment of the present disclosure. For reasons ofclarity and consistency, similar elements appearing in FIGS. 1-9 arelabeled the same, and the details of these elements are not necessarilyrepeated again below.

Referring to FIG. 5, a substrate 60 is provided. A M_(X) interconnectlayer including the dielectric material 70 and the conductive elements80 is formed over the substrate 60. A polishing process 90 is performedto planarize the surface of the M_(X) interconnect layer.

Referring now to FIG. 6, a plurality of metal capping layers 200 isformed. Each metal capping layer 200 is formed on the upper surface of arespective conductive element 80, but not on the surface of thedielectric material 70. In some embodiments, the metal capping layer 200is formed by a selective CVD process. The metal capping layer 200contains cobalt in the present embodiment but may contain other suitablemetal materials in alternative embodiments. The metal capping layer 200is formed to have a thickness 220. In some embodiments, the thickness220 is in a range from about 2 nanometers to about 5 nanometers.

Referring now to FIG. 7, an etching stop layer 100 is formed via an SALDprocess 110. The details of the SALD process 110 are the same as thatdiscussed above with reference to FIG. 2 and will not be repeated hereinfor reasons of simplicity. The SALD process 110 forms the etching stoplayer 100 (containing a metal oxide material) on the surfaces of thedielectric material 70 but not on the surfaces of the metal cappinglayer 200. The etching stop layer 100 is also formed to have a thickness120, which is about the same as the thickness 220 of the metal cappinglayer 200. In other words, the thickness 120 of the etching stop layer100 is also in a range from about 2 nanometers to about 5 nanometers. Asdiscussed above, the value of the thickness 120 is optimally configuredso as to be not too thin or too thick, since the layer 100 may notadequately serve the etching stop function if it is formed too thin, andits selectively growth (not to be formed on the metal capping layer 200)may be too difficult to control if it is formed too thick.

Referring now to FIG. 8, another etching stop layer 130 is formed overthe etching stop layer 100 and over the metal capping layers 200. Again,the etching stop layer 130 has a different material composition than theetching stop layer 100. For example, the etching stop layer 130 maycontain silicon oxycarbide (SiOC) or silicon oxynitride (SiON), whilethe etching stop layer 100 may contain hafnium oxide, zirconium oxide,or aluminum oxide. The etching stop layer 130 also is formed to be in arange from about 2 nanometers to about 8 nanometers. In someembodiments, a thickness 140 of the etching stop layer 130 is in a rangefrom about 30 nanometers to about 60 nanometers, which allows theetching stop layer 200 to adequately serve its purpose as anetching-stop layer in a later etching process discussed below. As isshown in FIG. 8, a dielectric material 150 is also formed over theetching stop layer 130.

Referring now to FIG. 9, a via 160 and a conductive element 180 (of aM_(X+1) interconnect layer) are formed in the dielectric material 150.The via 160 is at least partially aligned with the conductive element80. The via 160 is also formed to extend through the etching stop layer130 and comes into direct physical contact with one of the metal cappinglayers 200. Since the metal capping layer 200 is electricallyconductive, the via 160 still electrically interconnects together theconductive elements 80 and 180. And regardless of how the via 160 isformed, the etching process used to form it by “opening” the etchingstop layer 130 will be stopped by the etching stop layer 100. In otherwords, the dielectric material 70 will not be inadvertently “punchedthrough” by the formation of the via 160. Thus, for reasons similar tothose discussed above with reference to FIG. 4, the embodiment shown inFIG. 9 also avoids the “tiger tooth” problems and can offer better gapfilling performance, relaxed process windows, and improved deviceperformance.

FIGS. 10-14 are diagrammatic fragmentary cross-sectional side views ofthe semiconductor device 50 at various stages of fabrication inaccordance with yet another embodiment of the present disclosure. Forreasons of clarity and consistency, similar elements appearing in FIGS.1-15 are labeled the same, and the details of these elements are notnecessarily repeated again below.

Referring to FIG. 10, a substrate 60 is provided. A M_(X) interconnectlayer including the dielectric material 70 and the conductive elements80 are formed over the substrate 60. A polishing process is performed toplanarize the surface of the M_(X) interconnect layer. A plurality ofmetal capping layers 200 is formed (for example by a selective CVDprocess) on the upper surfaces of the conductive element 80, but not onthe surface of the dielectric material 70. The metal capping layer 200is formed to have a thickness 220, which may be in a range from about 2nanometers to about 5 nanometers.

Referring now to FIG. 11, an etching stop layer 300 is formed via anSALD process 310. The details of the SALD process 310 are similar to theSALD process 110 discussed above with reference to FIG. 2. However,additional cycles may be performed to increase the thickness of theetching stop layer 300. In other words, the etching stop layer 300(containing a metal oxide material) is still formed on the surfaces ofthe dielectric material 70 but not on the surfaces of the metal cappinglayer 200, but the etching stop layer 300 has a thickness 320, which isthicker than the thickness 220 of the metal capping layer 200. In someembodiments, the thickness 320 of the etching stop layer 300 is a rangefrom about 6 nanometers to about 10 nanometers. Due to the increasedthickness 300, recesses 330 are formed by the etching stop layer 300 andthe metal capping layers 200.

Referring now to FIG. 12, a hard mask layer 340 is formed over theetching stop layer 300 and over the metal capping layers 200, therebyfilling the recesses 330. The hard mask layer 340 is formed by a hardmask deposition process 350. In some embodiments, the hard maskdeposition process 350 includes a spin-on dielectric process with thefollowing process conditions:

-   -   Sol-gel: ethanol/siloxane oligomers    -   Rotation speed: 1000-4000 revolutions per minute (RPM)    -   Baking temperature: 80 degrees Celsius—350 degrees Celsius    -   Ultraviolet (UV) curing: 350 degrees Celsius—400 degrees        Celsius, for about 60—120 seconds

The hard mask layer 340 has a different material composition than theetching stop layer 300. For example, the hard mask layer 340 may containsilicon oxide, while the etching stop layer 300 may contain hafniumoxide, zirconium oxide, or aluminum oxide. The hard mask layer 340 alsois formed to be at least several times thicker than the etching stoplayer 300. In some embodiments, a thickness 360 of the hard mask layer340 is in a range from about 20 nanometers to about 40 nanometers.

Referring now to FIG. 13, a polishing process (such as a chemicalmechanical polishing process) is performed to etch away portions of thehard mask layer 340 until it has a coplanar surface with the etchingstop layers 300. Thereafter, a dielectric material 150 is formed on thesurfaces of the hard mask layer 340 and on the etching stop layer 300.

Referring now to FIG. 14, a via 160 and a conductive element 180 (of aM_(X+1) interconnect layer) are formed in the dielectric material 150.The via 160 is formed by performing an etching process to etch anopening in the dielectric material 150, while the hard mask 340 (andalso the etching stop layer 300) serves as an etching stop layer. Thehard mask 340 is thereafter “opened” in another etching process, whilethe etching stop layer 300 serves as the etching stop layer to preventthe dielectric layer 70 from being inadvertently over-etched, due to ahigh etching selectivity (e.g., >100:1) between the hard mask layer 340and the etching stop layer 300. Alternatively, a single etching processmay be performed to etch both the dielectric material 150 and theportion of the hard mask disposed over the conductive element 80. Aslong as there is sufficient etching selectivity between the etching stoplayer 300 and the hard mask layer 340/the dielectric layer 150, theetching stop layer 300 can prevent etching of the dielectric material 70below.

Thus, after the etched opening is filled, the portion of the hard masklayer 340 disposed above one of the conductive elements 80 iseffectively replaced by a segment 160B of the via 160, whereas anothersegment 160A of the via 160 is disposed in the dielectric material 150.And since the metal capping layer 200 is electrically conductive, thevia 160 still electrically interconnects together the conductiveelements 80 and 180. In this manner, even though the steps aredifferent, this embodiment shown in FIGS. 10-14 still avoids the “tigertooth” problems and can offer better gap filling performance, relaxedprocess windows, and better device performance.

FIG. 15 is a flowchart of a method 500 of fabricating a semiconductordevice according to various aspects of the present disclosure. One ormore of the steps of the method 500 are performed as a part of afabrication process for a semiconductor technology node that is a5-nanometer technology node or smaller.

The method 500 includes a step 510 of forming a first conductive elementin a first dielectric material.

The method 500 includes a step 520 of forming, through a selectiveatomic layer deposition (ALD) process, a first etching stop layer on thefirst dielectric material but not on the first conductive element.

The method 500 includes a step 530 of forming a second etching stoplayer over the first etching stop layer. The second etching stop layerand the first etching stop layer have different material compositions.In some embodiments, the second etching stop layer is formed to be in arange from about 2 nanometers to about 8 nanometers. For example, thesecond etching stop layer may be 5-10 times thicker than the firstetching stop layer. In some embodiments, the material compositions ofthe first and second etching stop layer are configured such that thefirst and second etching stop layers have substantially differentetching rates. In other words, a high etching selectivity (e.g., greaterthan 100:1) exists between them. In some embodiments, the first etchingstop layer is formed to contain hafnium oxide, zirconium oxide, oraluminum oxide. In some embodiments, the second etching stop layer isformed to contain silicon oxycarbide (SiOC) or silicon oxynitride(SiON).

The method 500 includes a step 540 of forming a second dielectric layerover the second etching stop layer. In some embodiments, both the firstdielectric layer and the second dielectric layer contain a low-kdielectric material.

The method 500 includes a step 550 of forming an opening in the seconddielectric layer through one or more etching processes, wherein theopening extends through the second etching stop layer but not throughthe first etching stop layer, and wherein the opening is at leastpartially aligned with the first conductive element.

The method 500 includes a step 560 of forming a second conductiveelement over the first conductive element by filling the opening.

It is understood that additional processes may be performed before,during, or after the steps 510-560 of the method 500 to complete thefabrication of the semiconductor device. For example, a third conductiveelement is over the second conductive element. The first conductiveelement is a first metal line of a M_(X) interconnect layer of aninterconnect structure. The third conductive element is a second metalline of a M_(X+1) interconnect layer of the interconnect structure. Thesecond conductive element is a via that interconnects the first andthird conductive elements together. For reasons of simplicity,additional fabrication steps are not discussed herein in detail.

Based on the above discussions, it can be seen that the presentdisclosure offers advantages over conventional methods and devices offorming vias. It is understood, however, that other embodiments mayoffer additional advantages, and not all advantages are necessarilydisclosed herein, and that no particular advantage is required for allembodiments. One advantage is that, as discussed above, by forming anextra etching stop layer, the present disclosure can prevent inadvertentover-etching of the ILD layer. As such, the overlay or alignmentrequirements for the via are relaxed. The via can be made larger, whichallows for better gap filling performance as well as reducing a contactresistance. Other advantages are that the present disclosure does notrequire many changes to the existing method of fabrication. As such, itdoes not significantly increase fabrication cost, if at all.

One aspect of the present disclosure pertains to a semiconductor device.The semiconductor device includes a first layer of an interconnectstructure formed over a substrate. The first layer contains a firstdielectric material and a first conductive element disposed in the firstdielectric material. The semiconductor device includes a first etchingstop layer that is disposed on the first dielectric material of thefirst layer but not on the first conductive element of the first layer.The semiconductor device includes a second conductive element disposedover the first layer. The second conductive element is at leastpartially aligned with, and electrically coupled to, the firstconductive element.

Another aspect of the present disclosure pertains to a semiconductordevice. The semiconductor device includes a M_(X) interconnect layer ofan interconnect structure disposed over a substrate. The M_(X)interconnect layer contains a first dielectric material and a pluralityof first metal lines disposed in the first dielectric material. Thesemiconductor device includes a first etching stop layer that isdisposed on the first dielectric material but not on the first metallines. The first etching stop layer contains hafnium oxide, zirconiumoxide, or aluminum oxide. The semiconductor device includes a secondetching stop layer disposed over the first etching stop layer, whereinthe second etching stop layer contains silicon oxycarbide (SiOC) orsilicon oxynitride (SiON). The semiconductor device includes a M_(X+1)interconnect layer of the interconnect structure disposed over the M_(X)interconnect layer. The M_(X+1) interconnect layer contains a seconddielectric material and a second metal line disposed in the seconddielectric material. The semiconductor device includes a via thatelectrically interconnects at least one of the first metal lines withthe second metal line. The via extends through the second etching stoplayer but not the first etching stop layer.

Yet another aspect of the present disclosure pertains to a method offabricating a semiconductor device. A first conductive element is formedin a first dielectric material. Through a selective atomic layerdeposition (ALD) process, a first etching stop layer is formed on thefirst dielectric material but not on the first conductive element. Asecond conductive element is formed over the first conductive element.The second conductive element is formed to be at least partially alignedwith, and electrically coupled to, the first conductive element.

The foregoing has outlined features of several embodiments so that thoseskilled in the art may better understand the detailed description thatfollows. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A semiconductor device, comprising: a first layerlocated over a substrate, wherein the first layer includes a firstdielectric component and a first conductive component; a first etchingstop layer located over the first dielectric component; a metal cappinglayer located over the first conductive component; a second etching stoplayer located over the first etching stop layer and over the metalcapping layer; a second layer located over the second etching stoplayer, wherein the second layer includes a second dielectric componentand a second conductive component; and a third conductive component thatelectrically interconnects the second conductive component to the firstconductive component.
 2. The semiconductor device of claim 1, wherein:the first layer includes a MX interconnect layer of a multi-layeredinterconnect structure; and the second layer includes a MX+1interconnect layer of the multi-layered interconnect structure.
 3. Thesemiconductor device of claim 2, wherein: the first conductive componentincludes a metal line of the MX interconnect layer; the secondconductive component includes a second metal line of the MX+1interconnect layer; and the third conductive component includes a viabetween the MX interconnect layer and the MX+1 interconnect layer. 4.The semiconductor device of claim 1, wherein the first etching stoplayer and the second etching stop layer have different materialcompositions.
 5. The semiconductor device of claim 4, wherein: the firstetching stop layer includes hafnium oxide, zirconium oxide, or aluminumoxide; and the second etching stop layer includes silicon oxycarbide(SiOC) or silicon oxynitride (SiON).
 6. The semiconductor device ofclaim 1, wherein the first etching stop layer is thinner than the secondetching stop layer.
 7. The semiconductor device of claim 1, wherein aportion of the third conductive components extends vertically throughthe second etching stop layer.
 8. The semiconductor device of claim 7,the third conductive component is free from extending vertically intothe first etching stop layer.
 9. The semiconductor device of claim 1,wherein the metal capping layer is aligned with the first conductivecomponent but not with the first dielectric component.
 10. Thesemiconductor device of claim 1, wherein the third conductive componentis misaligned with the first conductive component.
 11. A semiconductordevice, comprising: a MX interconnect layer of a multi-layeredinterconnect structure formed over a substrate, wherein the MXinterconnect layer includes a first dielectric component and a firstconductive component; a first etching stop layer formed over the firstdielectric component, wherein the first etching stop layer has a firstmaterial composition; a metal capping layer formed over the firstconductive component; a second etching stop layer formed over the firstetching stop layer and over the metal capping layer, wherein the secondetching stop layer has a second material composition that is differentfrom the first material composition; a MX+1 interconnect layer of themulti-layered interconnect structure, wherein the MX+1 interconnectlayer is formed over the second etching stop layer, and wherein the MX+1interconnect layer includes a second dielectric component and a secondconductive component; and a via that is located between, andelectrically couples together, the second conductive component and thefirst conductive component.
 12. The semiconductor device of claim 11,wherein: the second etching stop layer is thicker than the first etchingstop layer; the first etching stop layer includes hafnium oxide,zirconium oxide, or aluminum oxide; and the second etching stop layerincludes silicon oxycarbide (SiOC) or silicon oxynitride (SiON).
 13. Amethod, comprising: polishing upper surfaces of a first interconnectlayer that includes a first dielectric layer and a first conductivelayer; forming a metal capping layer over the first conductive layer butnot over the first dielectric layer; forming a first etching stop layerover the first dielectric layer but not over the first conductive layer;forming a second etching stop layer over the first etching stop layer,wherein the second etching stop layer and the first etching stop layerhave different material compositions; and forming a second interconnectlayer over the second etching stop layer.
 14. The method of claim 13,wherein the first etching stop layer is formed using a selective atomiclayer deposition (SALD) process.
 15. The method of claim 14, wherein theSALD process comprises a plurality of alternating first and secondcycles in which a precursor gas is turned on in the first cycle and anoxidant gas is turned on for the second cycle, and wherein the precursorgas include Tetrakisethylmethylaminohafnium (TEMAHf),Tetrakis(ethylmethylamido)zirconium (TEMA-Zr), Trimethyl Aluminum (TMA),or Tetrakis(dimethylamido) Aluminum (TDMAA).
 16. The method of claim 13,wherein the forming of the second interconnect layer includes: forming asecond dielectric layer over the second etching stop layer; and etchingan opening in the second dielectric layer, wherein an etchingselectivity exists between the first etching layer and the secondetching layer during the etching.
 17. The method of claim 16, whereinthe opening is etched such that the opening is etched through the secondetching stop layer but stops at the first etching stop layer.
 18. Themethod of claim 16, wherein the opening is etched such that the openingis partially misaligned with the first conductive layer.
 19. The methodof claim 13, wherein: the first etching stop layer is formed to containhafnium oxide, zirconium oxide, or aluminum oxide; and the secondetching stop layer is formed to contain silicon oxycarbide (SiOC) orsilicon oxynitride (SiON).
 20. The method of claim 13, wherein thesecond etching stop layer is formed to be thicker than the first etchingstop layer.